Analysis Equipment Product List and Ranking from 16 Manufacturers, Suppliers and Companies
Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.
Analysis Equipment Manufacturer, Suppliers and Company Rankings
Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.
- 東邦電機工業 本社 相模工場 営業所（北海道・東北・東京・名古屋・大阪・四国・九州） Kanagawa//Building materials, supplies and fixtures manufacturers
- 日本カンタム・デザイン Tokyo//Government
- アーカイブティップス 本社 Tokyo//Trading company/Wholesale
- 4 フォトテクニカ Saitama//others
- 5 デルフトハイテック Kanagawa//Trading company/Wholesale
Analysis Equipment Product ranking
Last Updated： Aggregation Period:Nov 19, 2025～Dec 16, 2025
This ranking is based on the number of page views on our site.
- VAM analysis device 東邦電機工業 本社 相模工場 営業所（北海道・東北・東京・名古屋・大阪・四国・九州）
- Nanoparticle analysis device NanoSight 日本カンタム・デザイン
- 1,400fps high sampling motion analysis system Qualisys アーカイブティップス 本社
- 4 VAM Analysis Device <iOS Compatible Version> 東邦電機工業 本社 相模工場 営業所（北海道・東北・東京・名古屋・大阪・四国・九州）
- 5 OLE デルフトハイテック
Analysis Equipment Product List
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The state of analysis techniques, starting with the failure analysis of bonding, adhesion, and assembly parts.
Introducing the perspectives from which analysis and analytical techniques should be advanced!
Our company supports customers in solving their challenges and problems not only with electronic components but also with a wide range of products, parts, and materials, including inorganic and organic materials, through failure analysis, defect analysis, structural analysis, and reliability evaluation. This document introduces how to approach analysis and evaluation techniques from various perspectives. We hope it serves as a starting point and a helpful resource for our customers in resolving issues. [Contents] ■ Introduction ■ Image of Joining and Positioning of Our Evaluation and Analysis Techniques ■ Causes of Defects ■ Methods ■ Conclusion *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
![[Data] Examples of Issues and Analysis of Solar Cells](https://image.www.ipros.com/public/product/image/8ac/2000477851/IPROS65825463468471618599.png?w=280&h=280)
[Data] Examples of Issues and Analysis of Solar Cells
We are publishing examples of defect analysis and analysis conducted through various approaches!
This document introduces the defects of solar cell modules and presents cases where various cross-sectional analyses were conducted for observation and analysis, along with the factors contributing to degradation. It includes an introduction to the "basic structure of solar cells" as well as "non-destructive analysis and destructive analysis," using diagrams and photographs. We encourage you to read it. 【Contents】 ■ Introduction ■ Basic Structure of Solar Cells ■ Non-Destructive Analysis and Destructive Analysis ■ Various Defect Modes ■ Conclusion *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
Crystal analysis by EBSD BGA
The EBSD method allows for the estimation of crystal states and residual stresses! Here is an example of BGA analysis.
Here is an example of BGA (Ball Grid Array) analysis. For observation using a microscope, both optical microscopy and SEM are employed. In crystal analysis using the EBSD method, we utilize Phase maps, Sn Grain maps, Sn IPF maps, and Sn GROD maps, which allow for the inference of crystal states and residual stresses. [Overview] ■ Crystal analysis using the EBSD method - Phase map - Sn Grain map - Sn IPF map - Sn GROD map *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
Identification of failure points in electronic components through thermal analysis.
It is possible to perform non-destructive testing from fault location identification to internal observation! High-precision identification of heat generation areas can be achieved.
Thermal analysis is a method for identifying defective areas by detecting the heat generated at leak points due to applied voltage using a high-sensitivity InSb camera. By detecting the weak heat generated from shorts and leaks with a high-sensitivity InSb camera, it is possible to non-destructively identify the failure points of electronic components such as semiconductors. Furthermore, non-destructive observation can also be performed using X-ray inspection equipment. 【Features】 ■ Identifying defective areas by detecting the heat generated at leak points with a high-sensitivity InSb camera ■ Analyzing samples in a non-destructive state, and analyzing electronic components that are difficult to analyze with OBIRCH or emission methods is also possible ■ By using the lock-in function to obtain phase information, it is possible to accurately identify the heat generation points *For more details, please refer to the PDF document or feel free to contact us.
- Company：アイテス
- Price：Other
![[Data] Power Control Loop Response Measurement (Bode Plot)](https://image.www.ipros.com/public/product/image/418/2000463117/IPROS82752168597206945085.jpeg?w=280&h=280)
[Data] Power Control Loop Response Measurement (Bode Plot)
About the measurement of power control loop response! Includes injection points and probing, etc.
The oscilloscope is a key measurement tool for engineers to test/evaluate power supply designs today. By adding the "R&S RTx-K36 Frequency Response Analysis (Bode Plot) Option," it can also be used as a low-cost alternative to low-frequency network analyzers or dedicated standalone frequency analyzers. This document provides detailed information on topics such as "Injection Points and Probing," "Device Settings," and "Measurement Results." [Contents] ■ Challenges ■ Rohde & Schwarz Solutions ■ Measurement Setup ■ Summary *For more details, please refer to the PDF document or feel free to contact us.
- Company：ローデ・シュワルツ・ジャパン
- Price：Other
Biomolecular Interaction Analysis Device "QCM Sensor System"
Applicable to sensing specific molecules in fields such as life sciences, food chemistry, and environmental science.
The QCM sensor system (Quartz Crystal Microbalance) is a biosensing system that utilizes the piezoelectric effect of quartz crystals. It can be applied to the sensing of specific molecules in fields such as life sciences, food chemistry, and environmental science. It can measure minute mass changes on the order of picograms occurring on the QCM sensor. 【Features】 ○ Dynamic analysis is possible → Other methods (such as SPR and ELISA) only provide results after binding is complete → With dynamic analysis, it is possible to analyze the properties of biomolecules such as binding constants, dissociation constants, inhibition constants, and binding rates. For more details, please contact us or download the catalog.
- Company：サンライズ工業
- Price：Other
1,400fps high sampling motion analysis system Qualisys
Reliable tracking with high-speed sampling【Arqus A5】
The Qualisys motion capture system, the Arqus A5, supports high-speed sampling measurements at an industry-leading 1,400 fps. Additionally, by adjusting the field of view, it can be configured to a maximum of 10,000 fps. It also features unique technologies such as the Active Filter for outdoor use and IP67 waterproof and dustproof capabilities, allowing it to be used in measurement targets and environments that were previously impossible for conventional motion capture systems.
- Company：アーカイブティップス 本社
- Price：Other
Acoustic Analysis Device "MAC-784"
It is possible to collect and analyze generated sounds such as friction sounds and echo sounds to evaluate the characteristics of the work!
The MAC-784 is an acoustic analysis device that allows for the evaluation of work characteristics by collecting and analyzing generated sounds. By analyzing friction sounds and echo sounds, it enables the evaluation of work characteristics. Various processes such as analysis, waveform extraction, waveform combination, comparison, and filtering are possible. 【Features】 ■ Enables evaluation of work characteristics (such as hardness and density) through the analysis of friction sounds and echo sounds. ■ Various processes are possible, including analysis (time series data, power spectrum, color map, octave), waveform extraction, waveform combination, comparison, and filtering. ■ In addition to software, devices (mechanical and control) tailored to the work can be designed and manufactured. *For more details, please refer to the PDF materials or feel free to contact us.
- Company：松浦電弘社
- Price：Other
VAM analysis device
The loaded data can be analyzed using analysis software for conditional searches and trigger searches, which helps reduce analysis time.
We would like to introduce the "VAM Analysis Device," which allows for reading and data analysis of memory data from the Information Memory (VAM)/VAM32/VAM32II. The I/F unit used for reading the Information Memory (VAM) has been significantly compacted compared to the conventional Information Memory (VAM) reader (SD42243-01), making it even easier to carry. Our company leverages the technology developed for selecting LEDs and circuit board layout in railway signal and display devices for development design and manufacturing (prototype mass production). We can solve your problems such as "I want this type of alarm" or "Can you make something like this with LEDs?" so please feel free to contact us. 【Features】 ■ The power supply for the I/F unit is provided by the computer, so no separate AC power supply is needed. ■ The read data can be analyzed using software for conditional searches and trigger searches, which helps reduce analysis time. ■ The contents of the data and search results can be saved in CSV file format. *For more details, please download the PDF or feel free to contact us.
- Company：東邦電機工業 本社 相模工場 営業所（北海道・東北・東京・名古屋・大阪・四国・九州）
- Price：Other
Non-destructive sound analysis device "NEW EVOTIS"
A waveform acquisition display and waveform analysis device equipped with both impact force inspection and acoustic inspection functions.
The "NEW EVOTIS" is a non-destructive impact sound analysis device that allows for various customizations. This product is primarily intended for research and development purposes, such as human-based waveform feature extraction and parameter setting considerations. However, it also enables on-site judgment of quality while observing waveforms (with LED display and alarm buzzer on the panel surface). Please feel free to contact us if you have any requests. 【Features】 ■ Equipped with an acoustic microphone near the impact hammer to capture the waveform of the impact force and the acoustic waveform from the microphone. ■ The acquired waveforms are transferred to a computer and displayed on the same screen. ■ Waveforms can be displayed in real-time and stored within the computer, with retrieved data capable of being overlaid on the computer screen in up to eight different colors. *For more details, please download the PDF or feel free to contact us.
- Company：シスミック
- Price：Other
Ultra-compact spectral phase and intensity measurement analysis device (LX-SPIDER)
Smaller than a laptop and portable anywhere, easy alignment with automatic calibration feature.
The LX-SPIDER is a device that uses the SPIDER method for phase and intensity measurement of ultra-fast lasers, enabling single-shot measurements and real-time phase measurement and analysis. It is ultra-compact, easy to align, and equipped with an automatic calibration function. Features: ● Wavelength range: 750~900nm ● Pulse width: Optical set 1... 16~150fs Optical set 2... 70~300fs ● Measures spectral phase, intensity, and temporal intensity of Ti:Sa lasers to check performance ● Single-shot measurement ● Real-time analysis ● Equipped with automatic calibration function, no adjustment required upon delivery
- Company：フォトテクニカ
- Price：Other
